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ARRANGEMENT OF THE INTEGRATED MULTIPLEX INTER-UNIT TESTING IN MESH-CONNECTED LOGICAL MULTICONTROLLERS

Abstract

The article pays attention to the fact that one of the key challenges when developing logical multicontrollers is ensuring their fault tolerance and considers the task of arranging the operational embedded hardware-level test of mesh-connected multicontrollers to identify failures. A new approach to the multicontroller test based on the combination of self-test and mutual inter-unit test performed in multiplex mode is presented, which allows increasing the successful fault detection probability. Formal rules are defined for forming sets of testing and tested neighbours for each unit which are invariant to the location of the unit within the topological structure of the multicontroller and its dimension. It is shown that in contrast to the mutual inter-unit test mechanism, the same set of testing neighbours is used alternately to test the two units in multiplexed mode, and the result unit test is formed by applying the majority operation to the characteristics by all testing neighbours as well as by the tested unit itself in the course of its self-test. The formulae to determine the number of testing neighbours for each unit depending on the dimension of the multicontroller are given. The structural organization of the unit of bidimensional mesh-connected multicontroller equipped with the means of the integrated multiplex inter-unit testing is proposed. The configuration of the unit inputs and outputs indicating the methods of connecting multicontroller units is described; this configuration is required for implementing of the proposed approach to the arrangement of testing in two-dimensional multicontrollers. The analysis of the functioning of the unit of two-dimensional multicontroller when implementing a distributed testing procedure with the interaction of testing and tested neighbours is carried out. It is shown which additional inputs and outputs are necessary to carry out testing procedures in the multicontrollers of higher dimension.

About the Authors

Min Win Moe
Southwest State University
Russian Federation


Tun Nyunt Thein
Southwest State University
Russian Federation


I. V. Zotov
Southwest State University
Russian Federation


References

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Review

For citations:


Moe M.W., Thein T.N., Zotov I.V. ARRANGEMENT OF THE INTEGRATED MULTIPLEX INTER-UNIT TESTING IN MESH-CONNECTED LOGICAL MULTICONTROLLERS. Proceedings of the Southwest State University. 2016;(3):61-70. (In Russ.)

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ISSN 2223-1560 (Print)
ISSN 2686-6757 (Online)